Mathematics of Computation, Vol. 59, No. 200 (Oct., 1992), pp. 383-401 (19 pages) In this paper a new explicit finite element method for numerically solving the drift-diffusion semiconductor device ...
A stochastic distance measure is defined for a general diffusion process on a parameter space X. This distance is defined by ds2=∑ gijdxidxj where (gij) is the inverse of the covariance matrix of the ...
Semiconductor devices rely on robust predictive models of charge transport to optimise performance and ensure reliability. Contemporary research bridges traditional drift–diffusion approaches with ...
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